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A metallic phase in lightly doped La$_{2-x}$Sr$_{x}$CuO$_{4}$ observed by electron paramagnetic resonance

机译:轻微掺杂的金属相La $ _ {2-x} $ sr $ _ {x} $ CuO $ _ {4} $观察到   通过电子顺磁共振

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摘要

In the low doping range of $x$ from 0.01 to 0.06 inLa$_{2-x}$Sr$_{x}$CuO$_{4}$, a narrow electron paramagnetic resonance (EPR)line has been investigated. This line is distinct from the known broad line,both due to probing Mn$^{2+}$ ions. The narrow line is ascribed to metallicregions in the material, and its intensity increases exponentially upon coolingbelow $\sim$ 150 K. The activation energy deduced $\Delta$ = 460(50) K isnearly the same as that found in the doped superconducting regime by Raman andneutron scattering. The intensity of the narrow EPR line follows the sametemperature dependence as the resistivity anisotropy in lightly dopedLa$_{2-x}$Sr$_{x}$CuO$_{4}$ single crystals.
机译:在La $ _ {2-x} $ Sr $ _ {x} $ CuO $ _ {4} $的$ x $的低掺杂范围中,从0.01到0.06,已经研究了窄电子顺磁共振(EPR)线。这条线与已知的宽线不同,都是由于探测Mn $ ^ {2 +} $离子。窄线归因于材料中的金属区域,其强度在冷却到$ \ sim $ 150 K以下时呈指数增长。推导的$ \ Delta $ = 460(50)K的活化能与掺杂超导体系中的激发能几乎相同。通过拉曼和中子散射。窄EPR线的强度遵循与轻掺杂La $ _ {2-x} $ Sr $ _ {x} $ CuO $ _ {4} $单晶的电阻率各向异性相同的温度依赖性。

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